ESS provides resistor cards for use in attenuators, loads, and many other microwave absorber applications. Substrates include FR-4, Alumina, quartz and many others.
We can provide a range of resistance values from 10 ohms/sq. up to 400 ohms/sq.
L and H dimensions up to 10″, T dimension up to 0.25″
Standard Mica Resistance Card
Contact us if your application requires specific dimensions or resistances; details about our standard products are below:
The fixtures shown below can measure surface and volume Resistivity of solids, rubbers, plastics and many other electrical substrates. The fixtures can measure materials from low ohms to many Gig-ohms.
The photos above show the surface and volume resistivity fixtures manufactured by ESS. One fixture utilizes internal measurement electrodes. The top cover is a flat copper or aluminum plate used when measuring Volume Resistivity. The top cover has a fixed 10lb weight for repeatable top pressure during testing. The two other fixtures allow us to test a variety of test samples (length, width, etc.) Overall, all three of the test fixtures function based on the same principles.
Electrical Permittivity and Magnetic Permeability per ASTM-2520 and Low Permeability testing of RF Connectors, cables, for Low PIM applications per ASTM A342/A342M
ESS has test cavities from 1.5GHz to 37GHz for a wide range of material properties covering much of the microwave spectrum. Testing frequencies for Material Measurements include 5G Mobile data in the 25 -38 GHz range.
Frequencies include:
1.5 GHz
2.5 GHz
3.5 GHz
5.5 GHz
10 GHz
14.5 GHz
18 GHz
29.9 GHz
37 GHz
Measuring Dielectric Properties of Lossy and Low Loss Materials
Using our High-Q cavities, we can measure complex permittivity and permeability on most microwave dielectrics. These tests are performed per ASTM-2520. The photos below show examples of our test setups.
ESS also offers other methods to determine material properties. Depending on the frequency and material properties, S11, S21 and even capacitive coupling techniques are used to calculate the effective dielectric and magnetic properties of a wide variety of materials.
We can accommodate most any customer supplied geometry or material. Contact ESS for more information on the best method to test your materials.
ESS is capable of measuring the RF leakage of connectors and cable assemblies.
ESS currently has two testing methods:
tri-axial cell manufactured per MIL-C-39012
screen-room chamber manufactured per EIA 364-66A
Note: Fixtures are not manufactured as a product for sale by ESS. Internal components, test procedures, and design is proprietary.
The tri-axial cell testing method is capable of measurements in excess of –100dB using an appropriate vector network analyzer. This test fixture accommodates large diameters, long lengths and most any configuration needed for components. The longest cable we have tested is 20ft. Contact us if your cable is longer than 20ft and we can discuss the possibilities! Our test setup works for frequencies of 500MHz – 18GHz.
Note: This testing is designed for connectors and relatively short cables. As cable length and/or frequency increases, the data can be affected by the calibration and the loss of the cables and test system.
The screen-room chamber testing method is capable of measurements in excess of -100dB using an appropriate vector network analyzer. Our chamber is 24″ x 18″ x 18″. Our test setup works from 2 – 10GHz. This method can accommodate long cables with large diameters because they can be coiled up; they don’t have to be stretched out. Contact us for more information on this test method!
The photos below show the 15 and 20 foot tri-axial cell extension setup, oversized cavities for large diameters/large right-angle connectors in the tri-axial setup, and the open and closed screen-room chamber.
