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ESS has test cavities at   1.5, 3.5, 5.5, 10, 18, 29.9 and 37 GHz, for a wide range of material properties covering much of the microwave spectrum.




Using our High Q cavities, we can measure complex permittivity and permeability on most microwave dielectrics.  These tests are performed per ASTM-2520.  The photos below show our  3.0 GHz. and a 10.0 GHz. cavities although we have dielectric material measurement cavity fixtures at  other frequencies as well.


Testing frequencies for Material Measurements now include 5G Mobile data in the 25 -38 GHz range.




Other photos, on this page show other methods that we use here to determine material properties.   Depending on the frequency and material properties, S11, S21 and even capacitive coupling techniques are used to calculate the effective dielectric and magnetic properties of a wide variety of materials.   The photo on the right is a WR-90 NRL Arch measurement setup for


At ESS, we have many methods of testing materials for dielectric properties using S11, S21, and cavities

in stripline, waveguide and coaxial fixtures.   We can accommodate most any customer supplied geometry or material.   Contact ESS for the best method to test your materials.



The photos to the top and left of this block show our S band cavity for Material testing.  Our cavities have quality factors, (Q) of over 5000 typically.
The photograph to the left shows a typical S21 arch style measurement for testing large dielectric sheets and samples  typically used in radomes  and other resonant dielectrics. The test setup shown is used at  10 GHz. 

The photos above show a coaxial fixture with capacitive coupling that we use to measure dielectric properties in an S21 environment.

The photo cavity to the left is a reduced height WR650 resonant cavity with a Q of greater than 5000 for measuring very low loss, and high K dielectric properties at 1.5 GHz.
The two photos on the left show an S21 transmission cavity used to extract dielectric properties from coaxial cross sections of samples provided.  Samples must be made to a very tight, but slide fit into the coax line for minimal errors. This setup is mostly used for higher K materials with higher loss tangents.  Low K values and low loss materials have higher errors as they  approach the air line constants.


As shown in the figure, this method also allows for testing at elevated temperatures using a hot plate.

The photos to the left, shows a WR284 slotted waveguide fixture used to measure S21 loss of materials from which we can calculated dielectric properties or provide plotted insertion loss per length.